Simulating of charge build-up in irradiated MOS/SOI transistors
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چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Proceedings of the National Academy of Sciences of Belarus. Physics and Mathematics Series
سال: 2020
ISSN: 2524-2415,1561-2430
DOI: 10.29235/1561-2430-2019-55-4-498-504